Preliminary Guidelines and Predictions for 14-MeV Neutron SEE Testing

被引:11
作者
Weulersse, Cecile [1 ]
Guibbaud, Nicolas [2 ]
Beltrando, Anne-Lise [3 ]
Galinat, Jeremy [4 ]
Beltrando, Cyrille [3 ]
Miller, Florent [2 ]
Trochet, Patrick [4 ]
Alexandrescu, Dan [3 ]
机构
[1] Airbus Grp Innovat, F-31025 Toulouse, France
[2] Airbus Grp Innovat, F-92150 Suresnes, France
[3] iRoC Technol, F-38025 Grenoble, France
[4] Nucletudes, F-91940 Les Ulis, France
关键词
14-MeV neutrons; single-event effect (SEE); spallation sources; SINGLE EVENT UPSETS; CROSS-SECTION; ENERGY; SRAM;
D O I
10.1109/TNS.2017.2660583
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper aims at better defining the scope of applicability of a 14-MeV neutron source for single-event effect characterization. Based on an analysis of the neutron nuclear recoils and experiments on multiple devices (SRAM, SDRAM, FPGA) and feature sizes, the data are compared with results gathered with white neutron beams. As expected, the results are close for single-event upset in most technologies but, for most devices, the higher energy atmospheric spectra produce more multiple-cell upset and single-event latch-up. Finally, a simplified model is proposed to extrapolate 14-MeV neutron data to terrestrial environments.
引用
收藏
页码:2268 / 2275
页数:8
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