Optimising test sets for a low noise amplifier with a defect-oriented approach

被引：1
|
作者：
Kheriji, R [1 ]
Danelon, V [1 ]
Carbonero, JL [1 ]
Mir, S [1 ]
机构：
[1] ST Microelect, F-38926 Crolles, France
来源：
DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, VOLS 1 AND 2, PROCEEDINGS | 2005年
关键词：
D O I：
10.1109/DATE.2005.233
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
This paper is aimed at studying defect-oriented test techniques for RF components in order to optimize production test sets. This study is mandatory for the definition of an efficient test flow strategy. We have carried out a fault simulation campaign for a Low-Noise Amplifier (LNA) for reducing a test set while maintaining high fault coverage. The set of production test measurements should include low-cost structural tests such as simple current consumption and only a few more sophisticated tests dedicated to functional specifications such as S parameters, Noise Figure (NF) or IP3.
引用
收藏
页码：170 / 171
页数：2
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