Tuning the point-defect evolution, optical transitions, and absorption edge of zinc oxide film by thermal exposure during molecular beam epitaxy growth

被引:11
作者
Darma, Yudi [1 ]
Muhammady, Shibghatullah [1 ]
Hendri, Yasni Novi [1 ]
Sustini, Euis [1 ]
Widita, Rena [1 ]
Takase, Kouichi [2 ]
机构
[1] Inst Teknol Bandung, Fac Math & Nat Sci, Dept Phys, Bandung 40132, Indonesia
[2] Nihon Univ, Coll Sci & Technol, Dept Phys, Chiyoda Ku, Tokyo 1010062, Japan
关键词
Optical properties; Zinc oxide; Point defect; Photoluminescence; Kubelka-Munk spectra; ZNO THIN-FILMS; EXCITONIC STIMULATED-EMISSION; GRAIN-SIZE; BAND-GAP; LUMINESCENT CENTER; PHOTOLUMINESCENCE; DEPENDENCE; SILICON; SUBSTRATE; CENTERS;
D O I
10.1016/j.mssp.2018.12.030
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We study the optical properties of ZnO films grown using plasma-assisted molecular beam epitaxy. We employ three different growth temperatures (T-growth) o f 298, 373, and 423 K. The XRD patterns and field-emission SEM images indicate that T-growth increment linearly increases the c-axis strain and average growth rate. The photoluminescence spectra show that T-growth increment from 298 to 373 K induces the blue-violet emission promoted by Zn interstitials (Zn-i). We also observe the blue emission promoted by the few O interstitials (O-i). However, this T-growth increment significantly reduces oxygen antisites (O-zn) and eliminates oxygen and zinc vacancies (V-o,V-zn). We find that T-growth increment to 423 K enhances O-i and eliminates Zn-i inducing the excellent blue emission the O-rich condition. Notably, the point defects suppress the exciton-exciton scattering emission for T-growth = 373 and 423 K. Furthermore, the Kubelka-Munk spectra show that the strain provokes the free-excitonic absorption edge redshift. Our result emphasizes the significant thermal dependences of point-defect evolution, blue emission, and excitonic absorption in ZnO film. This study opens a possible application of ZnO in tunable-emission blue LEDs.
引用
收藏
页码:50 / 58
页数:9
相关论文
共 59 条
  • [11] Structural and optical characterization of ZnO and AZO thin films: the influence of post-annealing
    Dejam, Laya
    Elahi, S. Mohammad
    Nazari, Heydar Honarvar
    Elahi, Hossein
    Solaymani, Shahram
    Ghaderi, Atefeh
    [J]. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2016, 27 (01) : 685 - 696
  • [12] Enhanced blue emission of ZnO films deposited on AIN substrates
    Ding, Jijun
    Chen, Haixia
    Fu, Haiwei
    [J]. PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, 2017, 90 : 61 - 66
  • [13] ZnO nanostructures for optoelectronics: Material properties and device applications
    Djurisic, A. B.
    Ng, A. M. C.
    Chen, X. Y.
    [J]. PROGRESS IN QUANTUM ELECTRONICS, 2010, 34 (04) : 191 - 259
  • [14] Dzimbeg-Malcic V, 2011, TEH VJESN, V18, P117
  • [15] Epitaxial ZnO piezoelectric thin films for saw filters
    Emanetoglu, NW
    Gorla, C
    Liu, Y
    Liang, S
    Lu, Y
    [J]. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 1999, 2 (03) : 247 - 252
  • [16] Blue luminescent center in ZnO films deposited on silicon substrates
    Fang, ZB
    Wang, YY
    Xu, DY
    Tan, YS
    Liu, XQ
    [J]. OPTICAL MATERIALS, 2004, 26 (03) : 239 - 242
  • [17] Effect of substrate-induced strain on the structural, electrical, and optical properties of polycrystalline ZnO thin films
    Ghosh, R
    Basak, D
    Fujihara, S
    [J]. JOURNAL OF APPLIED PHYSICS, 2004, 96 (05) : 2689 - 2692
  • [18] Intensity dependence and transient dynamics of donor-acceptor pair recombination in ZnO thin films grown on (001) silicon
    Guo, B
    Qiu, ZR
    Wong, KS
    [J]. APPLIED PHYSICS LETTERS, 2003, 82 (14) : 2290 - 2292
  • [19] Origin of green luminescence in ZnO thin film grown by molecular-beam epitaxy
    Heo, YW
    Norton, DP
    Pearton, SJ
    [J]. JOURNAL OF APPLIED PHYSICS, 2005, 98 (07)
  • [20] ACCURATE LATTICE-CONSTANTS FROM MULTIPLE REFLECTION MEASUREMENTS .2. LATTICE-CONSTANTS OF GERMANIUM, SILICON AND DIAMOND
    HOM, T
    KISZENICK, W
    POST, B
    [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1975, 8 (AUG1) : 457 - 458