Dependence of Apertureless Scanning Near-Field Spectroscopy on Nanoscale Refractive Index Changes

被引:7
作者
Dab, Chahinez [1 ]
Kolhatkar, Gitanjali [1 ]
Plathier, Julien [1 ]
Thomas, Reji [1 ]
Ruediger, Andreas [1 ]
机构
[1] Inst Natl Rech Sci, Ctr Energie, Mat, Telecommun, 1650 Blvd Lionel Boulet, Varennes, PQ J3X 1S2, Canada
基金
加拿大自然科学与工程研究理事会;
关键词
Surface plasmons; Raman spectroscopy; Near-field microscopy; Finite element method; TIP-ENHANCED RAMAN; NUMERICAL-SIMULATION; OPTICAL-PROPERTIES; LEAD TITANATE; FILMS; FERROELECTRICITY; SCATTERING; LIGHT; NANOPARTICLES;
D O I
10.1007/s11468-016-0488-7
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We numerically investigate the spectral dependence of the electric field enhancement on a gold tip above PbTiO3 on platinum systems by means of a finite element approach. The localized surface plasmon resonance (LSPR) is verified to change with the incident angle, the tip radius, and the tip-sample distance as well as with the refractive index of the sample underneath the tip. The refractive index sensitivity reveals detectable variations of the LSPR peak's wavelength and maximum field enhancement, respectively, large enough to discriminate, e.g., between ferroelectric and paraelectric PbTiO3 in tip-enhanced Raman spectroscopy (TERS) configuration.
引用
收藏
页码:99 / 106
页数:8
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