Screening for artifacts in near-field scanning photocurrent microscopy images of polymer solar cells

被引：4
作者：
McNeill, CR [1 ]
Fell, CJR [1 ]
Holdsworth, JL [1 ]
Dastoor, PC [1 ]
机构：
[1] Univ Newcastle, Sch Math & Phys Sci, Discipline Phys, Callaghan, NSW 2308, Australia
来源：
SYNTHETIC METALS | 2005年 / 153卷 / 1-3期
关键词：
solar cells; polyfluorene blends; NSOM;
D O I：
10.1016/j.synthmet.2005.07.159
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
We present the results of an investigation to screen for the presence of artifacts in near-field scanning photocurrent microscopy (NSPM) images of polymer solar cells caused by variations in tip-sample separation. We show that by increasing the size of the probe tip we are able to deliberately degrade the surface topographical image without altering the photocurrent image. This work demonstrates that NSPM images of polymer solar cells reliably probe the local charge generation properties of the device and are not significantly influenced by the presence of artifacts. Polyfluorene blend solar cells are used as a model system for this study.
引用
收藏
页码：85 / 88
页数：4
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