Thin-film perfect infrared absorbers over single- and dual-band atmospheric windows

被引：21
作者：
Zhang, Jihua [1 ]
Wei, Ran [1 ]
ElKabbash, Mohamed [1 ]
Campbell, E. Michael [2 ]
Guo, Chunlei [1 ]
机构：
[1] Univ Rochester, Inst Opt, Rochester, NY 14627 USA
[2] Univ Rochester, Lab Laser Energet, Rochester, NY 14623 USA
来源：
OPTICS LETTERS | 2020年 / 45卷 / 10期
关键词：
METAMATERIAL ABSORBER; ABSORPTION;
D O I：
10.1364/OL.392651
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A thin-film perfect electromagnetic absorber with a tunable response in the infrared (IR) region is proposed using a metal-dielectric-metal configuration, which consists of a Ti top layer and a Ge spacer layer on a Ti substrate. The thin-film structure simplifies the absorber design by tuning the thicknesses of the two layers, which is suitable for large-scale fabrication by matured deposition technologies. The absorber supports perfect IR absorption with tunability from 3 mu m to over 15 mu m. Furthermore, the total thickness is much smaller than the wavelength, and the absorption has small iridescence. Based on this design, we demonstrated two samples with one supporting single-band absorption in the atmospheric absorption window (5-8 mu m) and the other one supporting dual-band absorption in the two atmospheric transmission windows (3-5 and 8-13 mu m). These absorption signatures can find applications in IR invisibility and radiative cooling. (C) 2020 Optical Society of America
引用
收藏
页码：2800 / 2803
页数：4
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