Optical properties of semiconductors clusters grown into mordenite and MCM-41 matrices

Optical reflectance and transmittance measurements were taken on US semiconductor clusters grown into MOR type zeolites and MCM-41 mesoporous molecular sieves. The refractive index and extinction coefficient of these structures were determined in the visible range as a function of wavelength by means of a computational program based on a theoretical model using the matrix method. Large variations of the optical constants were observed in a small wavelength interval in the visible range, which point out the possibility to obtain new materials based on semiconductor nanoclusters deposited on zeolites for non-linear optical applications. Finally, from the absorption coefficient, the band gap of the structures was determined. (C) 2001 Elsevier Science B.V. All rights reserved.