Characterization of flat and bent crystals for X-ray spectroscopy and imaging

被引：2

作者：

Holzer, G ^{[1
]}

Wehrhan, O ^{[1
]}

Forster, E ^{[1
]}

机构：

[1] Friedrich Schiller Univ, Inst Opt & Quantenelekt, Abt Rontgenopt, D-07743 Jena, Germany

来源：

CRYSTAL RESEARCH AND TECHNOLOGY | 1998年 / 33卷 / 04期

关键词：

D O I：

10.1002/(SICI)1521-4079(1998)33:4<555::AID-CRAT555>3.0.CO;2-Q

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

Theoretical and experimental methods for the characterization of the reflection properties of flat and bent crystals are presented. The computer code DIXI for the simulation of reflection curves in the Bragg case is briefly described. Essential effects of the dynamical theory of x-ray diffraction are illustrated with selected examples. Results from diffractometric and topographic methods for quality control of bent crystals are presented.

引用

页码：555 / 567

页数：13

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