Large tunnel magnetoresistance with plasma oxidized MgO barrier

被引:14
作者
Dimopoulos, T
Gieres, G
Wecker, J
Wiese, N
Luo, Y
Samwer, K
机构
[1] Siemens AG, Corp Technol Mat & Microsyst, D-91052 Erlangen, Germany
[2] Univ Bielefeld, Nanodevice Grp, D-33615 Bielefeld, Germany
[3] Univ Gottingen, Inst Phys 1, D-37077 Gottingen, Germany
关键词
D O I
10.1063/1.2077847
中图分类号
O59 [应用物理学];
学科分类号
摘要
This work focuses on magnetic tunnel junctions with a polycrystalline MgO barrier, prepared by plasma oxidation. Combined with Co50Fe50 ferromagnetic electrodes, a large tunnel magnetoresistance (TMR) of 60% is obtained at room temperature. The TMR effect is comparable to state-of-the-art Al oxide barriers with amorphous CoFeB electrodes. It is also found to decrease with the MgO thickness. Two most significant advantages of the MgO junctions are pointed out: (a) The resistance-area product is approximately two orders of magnitude lower than for AlOX- based junctions of the same thickness. (b) MgO presents unsurpassed thermal stability for high annealing temperatures (up to 370 degrees C) and long annealing periods. In addition, for small, patterned elements, we have tested the switching behavior of the soft electrode grown on the polycrystalline MgO barrier. (c) 2005 American Institute of Physics.
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页数:5
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