Photon up-converting (Yb,Er)2O3 thin films by atomic layer deposition

被引：13

作者：

Tuomisto, Minnea ^{[1
,2
]}

Giedraityte, Zivile ^{[3
]}

Karppinen, Maarit ^{[3
]}

Lastusaari, Mika ^{[1
,4
]}

机构：

[1] Univ Turku, Dept Chem, FI-20014 Turku, Finland

[2] Univ Turku, Grad Sch UTUGS, Doctoral Programme Phys & Chem Sci, Turku, Finland

[3] Aalto Univ, Sch Chem Engn, Dept Chem & Mat Sci, POB 16100, FI-00076 Aalto, Finland

[4] Turku Univ, Ctr Mat & Surfaces MatSurf, Turku, Finland

来源：

PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS | 2017年 / 11卷 / 06期

基金：

芬兰科学院;

关键词：

atomic layer deposition; luminescence; thin film; up-conversion; OPTICAL-PROPERTIES; CONVERSION; NANOPARTICLES; ENHANCEMENT; PHOSPHORS; EPITAXY; GREEN; ER3+;

D O I：

10.1002/pssr.201700076

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We report up-converting (Yb,Er)(2)O-3 thin films grown with the atomic layer deposition (ALD) technique. The films are crystalline and show a homogeneous morphology with a roughness less than 1 nm for 40 nm thick films. High-intensity near-infrared (NIR) to green and red two-photon up-conversion emission is obtained with 974 nm excitation through an absorption by Yb3+, followed by a Yb3+-Er3+ energy transfer and emission from Er3+. The ALD technique promises to be excellent for producing up-converting films for many applications such as near-infrared radiation absorbing layers for solar cells and sensors in point-of-care biomedical diagnostics. [GRAPHICS] Schematic picture of the ALD-grown (Yb,Er)(2)O-3 thin film including the up-conversion emission spectra.

引用

页数：4

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