Ultrahigh frequency versus inductively coupled chlorine plasmas:: Comparisons of Cl and Cl2 concentrations and electron temperatures measured by trace rare gases optical emission spectroscopy

被引:77
作者
Malyshev, MV
Donnelly, VM
Samukawa, S
机构
[1] AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA
[2] NEC Corp Ltd, Silicon Syst Res Labs, Tsukuba, Ibaraki 305, Japan
关键词
D O I
10.1063/1.368820
中图分类号
O59 [应用物理学];
学科分类号
摘要
Using trace rare gases optical emission spectroscopy, Cl and Cl-2 number densities (n(Cl) and n(Cl2),) and electron temperatures (T-e) were measured for two source configurations of high-density chlorine plasmas. In one configuration, the reactor was outfitted with a spoke antenna, operated at a resonant ultrahigh frequency (UHF) of 500 MHz. Alternatively, the same reactor was configured with a single loop, inductively coupled plasma (ICP) source operated at a radio frequency of 13.56 MHz. Optical emission from trace amounts (1% each) of rare gases added to the main Cl-2 feed gas were recorded as a function of power and pressure. Modeling was used to derive T-e, from these data. Additional emission from Cl-2 (at 3050 Angstrom) and Cl (numerous lines between 7000 and 9000 Angstrom) normalized to the appropriate emission from the rare gases (i.e., actinometry) was used to obtain n(Cl2), and n(Cl). In the ICP plasma, T-e, decreased monotonically from 5.5 to 1.2 eV as a function of increasing pressure between 1 and 20 mTorr. Conversely, with the UHF configuration, T-e, was 3.3 eV, independent of pressure between 1 and similar to 7 mTorr, and then decreased to 1.7 eV as pressure was increased to 27 mTorr. At the same input power (1000 W), both sources resulted in electron densities of 1 x 10(11) cm(-3) at 3.5 mTorr, yet the UHF plasma was much less dissociated (30%) than the ICP plasma (70%). This can be attributed to differences in the electron energy distribution functions in the UHF and ICP plasmas, especially at low pressure. (C) 1998 American Institute of Physics.
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页码:1222 / 1230
页数:9
相关论文
共 38 条
[1]   Dependence of frequency and pressure on electron energy distribution functions in low pressure plasma [J].
Akashi, H ;
Samukawa, S ;
Takahashi, N ;
Sasaki, T .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1997, 36 (7A) :L877-L879
[2]   Electron impact excitation out of the metastable levels of argon into the 3p(5)4p J=3 level [J].
Boffard, JB ;
Piech, GA ;
Gehrke, MF ;
Lagus, ME ;
Anderson, LW ;
Lin, CC .
JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 1996, 29 (22) :L795-L800
[3]  
BOFFARD JB, 1997, 50 GAS EL C MAD WI O
[4]  
CHILTON JE, COMMUNICATION
[5]   Trace rare gases optical emission spectroscopy for determination of electron temperatures and species concentrations in chlorine-containing plasmas [J].
Donnelly, VM ;
Malyshev, MV ;
Kornblit, A ;
Ciampa, NA ;
Colonell, JI ;
Lee, JTC .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1998, 37 (4B) :2388-2393
[6]   A simple optical emission method for measuring percent dissociations of feed gases in plasmas: Application to Cl-2 in a high-density helical resonator plasma [J].
Donnelly, VM .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1996, 14 (03) :1076-1087
[7]  
FANG S, 1992, IEEE ELECT DEVICE LE, V13, P5
[8]   THIN-OXIDE DAMAGE FROM GATE CHARGING DURING PLASMA PROCESSING [J].
FANG, SC ;
MCVITTIE, JP .
IEEE ELECTRON DEVICE LETTERS, 1992, 13 (05) :288-290
[9]  
FELTSAN PV, 1967, UKR FIZ ZH, V12, P1423
[10]  
FELTSAN PV, 1968, UKR FIZ ZH, V13, P205