SIMS-A precursor and partner to contemporary mass spectrometry

被引:48
作者
Vickerman, John C. [1 ]
Winograd, Nicholas [2 ]
机构
[1] Univ Manchester, Manchester Inst Biotechnol, Manchester, Lancs, England
[2] Penn State Univ, Dept Chem, University Pk, PA 16802 USA
基金
英国工程与自然科学研究理事会;
关键词
Mass spectrometry; Cluster ion beams; Molecule-specific imaging; Molecular dynamics calculations; SIMS instrumentation; FAST-ATOM-BOMBARDMENT; SECONDARY-ION EMISSION; OF-FLIGHT SIMS; SINGLE-CRYSTAL SURFACES; TOF-SIMS; LIQUID-METAL; STATIC SIMS; MONOMOLECULAR LAYERS; MOLECULAR-DYNAMICS; ORGANIC-MOLECULES;
D O I
10.1016/j.ijms.2014.06.021
中图分类号
O64 [物理化学(理论化学)、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号
070203 ; 070304 ; 081704 ; 1406 ;
摘要
Significant events driving the development of SIMS over the last 50 years are reviewed. The discussion includes recollections of dynamic and static SIMS from the 1970s, of the emergence of TOF-SIMS during the 1980s and of the incorporation of cluster ion bombardment during most recent times. Advances in theoretical understanding of the sputtering phenomenon and of the ionization process that accompanied these advances are also included. Many early discoveries were focused upon the stimulated desorption of organic and bioorganic molecules, first via static SIMS and next via fast atom bombardment, that were important precursor experiments to modern day mass spectrometry. Today, submicron molecule-specific imaging and molecular depth profiling represent unique aspects of SIMS experiments. Developments that led to the optimization of these modalities are also emphasized in the review. In general, the characteristics of SIMS that make it a contemporary partner to modern day mass spectrometry are highlighted. (C) 2014 Elsevier B.V. All rights reserved.
引用
收藏
页码:568 / 579
页数:12
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