Wavelet transform-based impulse fault pattern recognition in distribution transformers

被引：7
|
作者：
Purkait, P [1 ]
Chakravorti, S
机构：
[1] Univ Queensland, Sch ITEE, St Lucia, Qld 4072, Australia
[2] Univ Jadavpur, Dept Elect Engn, Kolkata 700032, W Bengal, India
来源：
IEEE TRANSACTIONS ON POWER DELIVERY | 2003年 / 18卷 / 04期
关键词：
distribution transformer; impulse fault simulation; pattern recognition; wavelet transform;
D O I：
10.1109/TPWRD.2003.817845
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This letter presents a novel approach using the wavelet transform to classify the patterns inherent in different fault currents during impulse testing of distribution transformers. Results for simulated models of a range of distribution transformers are presented to illustrate the ability of this approach to classify insulation failures under impulse stresses.
引用
收藏
页码：1588 / 1589
页数：2
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