Raman and IR-ATR spectroscopy studies of heteroepitaxial structures with a GaN: C top layer

被引:8
作者
Cerqueira, M. F. [1 ]
Vieira, L. G. [1 ]
Alves, A. [2 ]
Correia, R. [2 ]
Huber, M. [3 ,4 ]
Andreev, A. [3 ]
Bonanni, A. [4 ]
Vasilevskiy, M. I. [1 ,5 ]
机构
[1] Univ Minho, Ctr & Dept Fis, Campus Gualtar, P-4710057 Braga, Portugal
[2] Univ Aveiro, Dept Fis & I3N, P-3710193 Aveiro, Portugal
[3] Infineon Technol Austria AG, Siemensstr 2, A-9500 Villach, Austria
[4] Johannes Kepler Univ Linz, Altenbergerstr 69, A-4040 Linz, Austria
[5] Univ Minho, QuantaLab, Braga, Portugal
基金
奥地利科学基金会;
关键词
Raman spectroscopy; ATR-IR spectroscopy; phonon; polariton; carbon doping; gallium nitride; SURFACE PHONON-POLARITON; CARBON; SCATTERING; SPECTRA; MODES; LUMINESCENCE; TEMPERATURE; IMPACT; ALN; SI;
D O I
10.1088/1361-6463/aa7c4b
中图分类号
O59 [应用物理学];
学科分类号
摘要
This work, motivated by the technologically important task of determination of carbon dopant location in the GaN crystal lattice, employed Raman spectroscopy, with both resonant and non-resonant excitation, and infrared (IR) spectroscopy, in the attenuated total reflection (ATR) configuration, to study lattice vibration modes in a set of carbon-doped GaN (GaN: C) epilayers grown by metalorganic vapour phase epitaxy. We analyse Raman and IR-ATR spectra from the point of view of possible effects of the carbon doping, namely: (i) local vibration mode of C atoms in the nitrogen sublattice (whose frequency we theoretically estimate as 768 cm(-1) using an isotope defect model), and (ii) shift in the positions of longitudinal modes owing to the phonon-plasmon coupling. We find only indirect hints of the doping effect on the resonant Raman spectra. However, we show theoretically and confirm experimentally that the IR-ATR spectroscopy can be a much more sensitive tool for this purpose, at least for the considered structures. A weak perturbation of the dielectric function of GaN: C, caused by the substitutional carbon impurity, is shown to produce a measurable dip in the ATR reflectivity spectra at approximate to 770 cm(-1) for both p-and s-polarizations. Moreover, it influences a specific (guided-wave type) mode observed at approximate to 737 cm(-1), originating from the GaN layer, which appears in the narrow frequency window where the real parts of the two components of the dielectric tensor of the hexagonal crystal have opposite signs. This interpretation is supported by our modelling of the whole multilayer structure, using a transfer matrix formalism.
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页数:12
相关论文
共 43 条
[1]   Impact of substrate temperature on the incorporation of carbon-related defects and mechanism for semi-insulating behavior in GaN grown by molecular beam epitaxy [J].
Armstrong, A ;
Poblenz, C ;
Green, DS ;
Mishra, UK ;
Speck, JS ;
Ringel, SA .
APPLIED PHYSICS LETTERS, 2006, 88 (08)
[2]   Impact of deep levels on the electrical conductivity and luminescence of gallium nitride codoped with carbon and silicon [J].
Armstrong, A ;
Arehart, AR ;
Green, D ;
Mishra, UK ;
Speck, JS ;
Ringel, SA .
JOURNAL OF APPLIED PHYSICS, 2005, 98 (05)
[3]   POLARIZED RAMAN-SPECTRA IN GAN [J].
AZUHATA, T ;
SOTA, T ;
SUZUKI, K ;
NAKAMURA, S .
JOURNAL OF PHYSICS-CONDENSED MATTER, 1995, 7 (10) :L129-L133
[5]   A PRIMER ON SURFACE PLASMON-POLARITONS IN GRAPHENE [J].
Bludov, Yu V. ;
Ferreira, Aires ;
Peres, N. M. R. ;
Vasilevskiy, M. I. .
INTERNATIONAL JOURNAL OF MODERN PHYSICS B, 2013, 27 (10)
[6]   Doping properties of C, Si, and Ge impurities in GaN and AlN [J].
Boguslawski, P ;
Bernholc, J .
PHYSICAL REVIEW B, 1997, 56 (15) :9496-9505
[7]   Ab initio phonon dispersions of wurtzite AlN, GaN, and InN [J].
Bungaro, C ;
Rapcewicz, K ;
Bernholc, J .
PHYSICAL REVIEW B, 2000, 61 (10) :6720-6725
[8]  
Cardona M., 1982, TOPICS APPL PHYS, V50
[9]   Raman study of insulating and conductive ZnO:(Al, Mn) thin films [J].
Cerqueira, M. F. ;
Viseu, T. ;
de Campos, J. Ayres ;
Rolo, A. G. ;
de Lacerda-Aroso, T. ;
Oliveira, F. ;
Bogdanovic-Radovic, I. ;
Alves, E. ;
Vasilevskiy, M. I. .
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2015, 212 (10) :2345-2354
[10]   Resonant Raman scattering in ZnO:Mn and ZnO:Mn:Al thin films grown by RF sputtering [J].
Cerqueira, M. F. ;
Vasilevskiy, M. I. ;
Oliveira, F. ;
Rolo, A. G. ;
Viseu, T. ;
Ayres de Campos, J. ;
Alves, E. ;
Correia, R. .
JOURNAL OF PHYSICS-CONDENSED MATTER, 2011, 23 (33)