Spontaneous Electrochemical Deposition of Copper from Organic Solutions on TaSiN

被引:0
作者
Li, Jingye [1 ]
You, Shaoxin
O'Keefe, Matthew J.
O'Keefe, Thomas J.
机构
[1] Univ Missouri, Dept Mat Sci & Engn, Rolla, MO 65401 USA
来源
SURFACE ENGINEERING, PROCEEDINGS | 2006年
关键词
D O I
暂无
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Uniform and high density copper seed crystals were deposited on TaSiN barrier layers using a novel process called Metal Immersion Deposition from Organic Solution (MOOS). The process evolved from an earlier process named galvanic stripping, which was used for metal ion separation and recovery from solvent extraction solutions. The mechanism for the deposition is based on electrochemical displacement reactions in which the more noble metal deposits on the surface of less noble metal. The organic media used are strong polarizers and have low electrical and ionic conductivity. The metal crystals deposited from such solution have special morphologies compared to those from aqueous solutions and will catalyze subsequent electroless Cu metal build up.
引用
收藏
页码:38 / +
页数:2
相关论文
共 13 条
[1]  
AVALOS N, 1994, THESIS U MISSOURI RO
[2]  
CHANG CM, 1996, P 2 INT S IR CONTR H, P471
[3]  
DAHLGREN EJ, 2003, THESIS U MISSOURI RO
[4]  
FANG M, 1998, ELECT PACKAGING SCI, V85
[5]   Spontaneous, non-aqueous electrochemical deposition of copper and palladium on Al and Al(Cu) thin films [J].
Fang, R ;
Gu, H ;
O'Keefe, MJ ;
O'Keefe, TJ ;
Shih, WS ;
Leedy, KD ;
Cortez, R .
JOURNAL OF ELECTRONIC MATERIALS, 2001, 30 (04) :349-354
[6]  
FANG R, 2001, THESIS U MISSOURI RO
[7]  
FLORES C, 1995, SEPARATION PROCESSES, P187
[8]   Influence of Ta/Si atomic ratio on the interdiffusion between Ta-Si-N and Cu at elevated temperature [J].
Lai, LW ;
Chen, JS ;
Hsu, WS .
JOURNAL OF APPLIED PHYSICS, 2003, 94 (08) :5396-5398
[9]  
LI JG, 2005, THESIS U MISSOURI RO
[10]   Characterization of organic solution deposited copper seed layers on Al(Cu) sputtered thin films [J].
O'Keefe, MJ ;
Leedy, KD ;
Grant, JT ;
Fang, M ;
Gu, H ;
O'Keefe, TJ .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1999, 17 (05) :2366-2372