Geiger mode simulation of GaN homojunction avalanche photodetectors
被引:4
作者:
Sridharan, Sriraaman
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Georgia Inst Technol, Sch Elect & Comp Engn, 210 Technol Circle, Savannah, GA 31407 USAGeorgia Inst Technol, Sch Elect & Comp Engn, 210 Technol Circle, Savannah, GA 31407 USA
Sridharan, Sriraaman
[1
]
Yoder, P. D.
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机构:
Georgia Inst Technol, Sch Elect & Comp Engn, 210 Technol Circle, Savannah, GA 31407 USAGeorgia Inst Technol, Sch Elect & Comp Engn, 210 Technol Circle, Savannah, GA 31407 USA
Yoder, P. D.
[1
]
Shen, S. C.
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Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USAGeorgia Inst Technol, Sch Elect & Comp Engn, 210 Technol Circle, Savannah, GA 31407 USA
Shen, S. C.
[2
]
Ryou, J. H.
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Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USAGeorgia Inst Technol, Sch Elect & Comp Engn, 210 Technol Circle, Savannah, GA 31407 USA
Ryou, J. H.
[2
]
Dupuis, R. D.
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机构:
Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USAGeorgia Inst Technol, Sch Elect & Comp Engn, 210 Technol Circle, Savannah, GA 31407 USA
Dupuis, R. D.
[2
]
机构:
[1] Georgia Inst Technol, Sch Elect & Comp Engn, 210 Technol Circle, Savannah, GA 31407 USA
[2] Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA
来源:
PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 6, SUPPL 2
|
2009年
/
6卷
关键词:
D O I:
10.1002/pssc.200880903
中图分类号:
O43 [光学];
学科分类号:
070207 ;
0803 ;
摘要:
We investigate the Geiger mode operation of wurtzite GaN-based homojunction avalanche photodiodes (APDs) via fullband ensemble Monte Carlo charge transport simulation. Critical design parameters for photon counting applications are identified, and their influence on single photon detection efficiency (SPDE) is quantified. Simulations demonstrate simultaneous reduction in breakdown field strength and growth in SPDE with increasing active region thickness. We also report a significant increase in avalanche growth rate with reduction in active region thickness, and relate for the first time the characteristic time scale to the product of avalanche coefficients and saturated drift velocities. (C) 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim