Structural study of nanometric electrodeposited Co films using 59Co NMR

被引:16
作者
Cerisier, M
Attenborough, K
Jedryka, E
Wojcik, M
Nadolski, S
Van Haesendonck, C
Celis, JP
机构
[1] IMEC, B-3001 Heverlee, Belgium
[2] Polish Acad Sci, Inst Phys, PL-02668 Warsaw, Poland
[3] Vaste Stof Fys & Magnetisme Lab, B-3001 Heverlee, Belgium
[4] Katholieke Univ Leuven, Dept MTM, B-3001 Heverlee, Belgium
关键词
D O I
10.1063/1.1354582
中图分类号
O59 [应用物理学];
学科分类号
摘要
A Co-59 NMR experiment has been used to investigate the structure of two series of Co films with thicknesses varying from 5 to 400 nm which were electrodeposited on Cu at the electrolyte pH value of 2.1 and 3.7, respectively. It was shown that the overall structure of studied Co films consists of a very good quality fcc phase and a heavily faulted hcp phase in about equal proportions. The exceptions are very thin Co layers (below 20 nm) where the hcp structure was stabilized at pH 3.7 and overpotential of 0.9 V. This effect is attributed to the formation of hexagonal cobalt hydroxide in the early stage of deposition, which acts as a buffer layer stabilizing Co hcp structure. (C) 2001 American Institute of Physics.
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收藏
页码:7083 / 7085
页数:3
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