Polychromatic excitation improves detection limits in total reflection X-ray fluorescence analysis compared with monochromatic excitation

被引:42
作者
Kunimura, Shinsuke [1 ]
Kawai, Jun [2 ]
机构
[1] RIKEN, Mat Fabricat Lab, Inst Phys & Chem Res, Wako, Saitama 3510198, Japan
[2] Kyoto Univ, Dept Mat Sci & Engn, Sakyo Ku, Kyoto 6068501, Japan
关键词
SPECTROMETER;
D O I
10.1039/c0an00009d
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
Detection limits obtained by a portable total reflection X-ray fluorescence (TXRF) spectrometer with or without a monochromator are compared. A 1WX-ray tube (tube voltage: 20 kV) is used in this spectrometer. Polychromatic excitation improves the detection limits in TXRF analysis with the low power X-ray tube compared with monochromatic excitation. A detection limit of 26 pg is achieved for Co when using the weak polychromatic X-rays.
引用
收藏
页码:1909 / 1911
页数:3
相关论文
共 10 条
[1]   TOTAL-REFLECTION X-RAY-FLUORESCENCE ANALYSIS USING MONOCHROMATIC BEAM [J].
IIDA, A ;
GOHSHI, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1984, 23 (11) :1543-1544
[2]  
KUNIMURA S, 2007, ADV XRAY CHEM ANAL J, V38, P367
[3]   Handy waveguide TXRF spectrometer for nanogram sensitivity [J].
Kunimura, Shinsuke ;
Kawaia, Jun .
POWDER DIFFRACTION, 2008, 23 (02) :146-149
[4]   Analysis of trace elements in soft drink, environmental water, and leaching solution of toy by using portable total reflection x-ray fluorescence spectrometer [J].
Kunimura, Shinsuke ;
Watanabe, Daisuke ;
Kawai, Jun .
BUNSEKI KAGAKU, 2008, 57 (02) :135-139
[5]   Portable total reflection X-ray fluorescence spectrometer for nanogram Cr detection limit [J].
Kunimura, Shinsuke ;
Kawai, Jun .
ANALYTICAL CHEMISTRY, 2007, 79 (06) :2593-2595
[6]   Adaptation of a commercial total reflection X-ray fluorescence system for wafer surface analysis equipped with a new generation of silicon drift detector [J].
Pahlke, Siegfried ;
Meirer, Florian ;
Wobrauschek, Peter ;
Streli, Christina ;
Westphal, Georg Peter ;
Mantler, Claus .
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 2006, 61 (10-11) :1110-1114
[7]   Total reflection X-ray fluorescence and grazing incidence X-ray spectrometry - Tools for micro- and surface analysis. A review [J].
von Bohlen, Alex .
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 2009, 64 (09) :821-832
[8]   Atomic spectrometry update. X-ray fluorescence spectrometry [J].
West, Margaret ;
Ellis, Andrew T. ;
Kregsamer, Peter ;
Potts, Philip J. ;
Streli, Christina ;
Vanhoof, Christine ;
Wobrauschek, Peter .
JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 2007, 22 (10) :1304-1332
[9]   Total reflection x-ray fluorescence analysis - a review [J].
Wobrauschek, P. .
X-RAY SPECTROMETRY, 2007, 36 (05) :289-300
[10]   Analysis of Ni on Si-wafer surfaces using synchrotron radiation excited total reflection X-ray fluorescence analysis [J].
Wobrauschek, P ;
Gorgl, R ;
Kregsamer, P ;
Streli, C ;
Pahlke, S ;
Fabry, L ;
Haller, M ;
Knochel, A ;
Radtke, M .
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1997, 52 (07) :901-906