Apparatus for small angle x-ray scattering measurements of polymer deformation

被引：4

作者：

Salomons, GJ ^{[1
]}

Singh, MA ^{[1
]}

Gupta, JA ^{[1
]}

Foran, WA ^{[1
]}

Clarke, JR ^{[1
]}

Capel, MS ^{[1
]}

机构：

[1] BROOKHAVEN NATL LAB,UPTON,NY 11973

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1996年 / 67卷 / 05期

关键词：

D O I：

10.1063/1.1146969

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We present an apparatus which is capable of small-angle x-ray scattering studies of polymer deformation at strain rates ranging from 49.6 mu m/s to less than 0.033 mu m/s and temperatures ranging from room (approximate to 22 degrees C) to 120 degrees C. The system also includes a load cell for measuring the force applied to the sample and a symmetric stretching system to keep the sample centered in the x-ray beam. (C) 1996 American Institute of Physics.

引用

页码：1748 / 1752

页数：5

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