Big, Deep, and Smart Data in Scanning Probe Microscopy

被引：97

作者：

Kalinin, Sergei V. ^{[1
,2
]}

Strelcov, Evgheni ^{[1
,2
]}

Belianinov, Alex ^{[1
,2
]}

Somnath, Suhas ^{[1
,2
]}

Vasudevan, Rama K. ^{[1
,2
]}

Lingerfelt, Eric J. ^{[1
,3
]}

Archibald, Richard K. ^{[1
,3
]}

Chen, Chaomei ^{[4
]}

Proksch, Roger ^{[5
]}

Laanait, Nouamane ^{[1
,2
]}

Jesse, Stephen ^{[1
,2
]}

机构：

[1] Oak Ridge Natl Lab, Inst Funct Imaging Mat, Oak Ridge, TN 37831 USA

[2] Oak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA

[3] Oak Ridge Natl Lab, Comp Sci & Math Div, Oak Ridge, TN 37831 USA

[4] Drexel Univ, Coll Comp & Informat, Philadelphia, PA 19104 USA

[5] Asylum Res, Santa Barbara, CA 93117 USA

来源：

ACS NANO | 2016年 / 10卷 / 10期

关键词：

ATOMIC-FORCE MICROSCOPY; BAND EXCITATION; ION DIFFUSION; SPECTROSCOPY; RECOGNITION; CANTILEVER; IDENTIFICATION; SURFACES; DYNAMICS; BEHAVIOR;

D O I：

10.1021/acsnano.6b04212

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Scanning probe microscopy (SPM) techniques have opened the door to nanoscience and nanotechnology by enabling imaging and manipulation of the structure and functionality of matter at nanometer and atomic scales. Here, we analyze the scientific discovery process in SPM by following the information flow from the tip surface junction, to knowledge adoption by the wider scientific community. We further discuss the challenges and opportunities offered by merging SPM with advanced data mining,, visual analytics, and knowledge discovery technologies.

引用

页码：9068 / 9086

页数：19

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