Preliminary Development and Application of a Stress-Strength Model for Reliability Estimation of Aged LV Cables for Nuclear Power Plants

被引：2

作者：

Fabiani, D. ^{[1
]}

Mazzanti, G. ^{[1
]}

Suraci, S., V ^{[1
]}

Diban, B. ^{[1
]}

机构：

[1] Univ Bologna, Dept Elect Energy Engn & Informat Guglielmo Marco, Viale Risorgimento 2, I-40136 Bologna, Italy

来源：

PROCEEDINGS OF THE 2020 3RD IEEE INTERNATIONAL CONFERENCE ON DIELECTRICS (ICD 2020) | 2020年

关键词：

D O I：

10.1109/ICD46958.2020.9341856

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

As a part of the H2020 EU Project called "TeaM Cables" - which has, among its aims, modelling reliability of Nuclear Power Plant (NPP) cables - the goal of this paper is to develop a model for the prediction of the residual reliability of Low Voltage (LV) cables for NPPs subjected to gamma radiation stress. The model estimates the probability that such cables withstand random stress overshoot in-service.

引用

页码：37 / 40

页数：4

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