Metallic and semiconducting nanowires: Properties and architectures

被引:0
作者
Erts, D [1 ]
Olin, H [1 ]
Holmes, JD [1 ]
机构
[1] Latvian State Univ, Inst Chem Phys, LV-1063 Riga, Latvia
来源
ADVANCED OPTICAL DEVICES, TECHNOLOGIES, AND MEDICAL APPLICATIONS | 2002年 / 5123卷
关键词
TEM-SPM; Scanning Probe Microscopy; nanowires; conductivity; mechanical properties; nanowire arrays; mesoporous materials;
D O I
暂无
中图分类号
R318 [生物医学工程];
学科分类号
0831 ;
摘要
Nanowires are expected to play an important role in future electronic, optical devices and nanoelectromechanical devices. Measuring the electrical and mechanical properties of nanowires is however a difficult task due to their small dimensions. Here we report the use of an in-situ microscopy technique, which combines transmission electron microscopy (TEM) with scanning probe microscopy (SPM), to investigate the electrical and mechanical properties of metallic and semiconductor nanowires. Additionally, in this paper we describe a novel approach for synthesizing mesoporous silicas with tunable pore diameters, wall thickness and. pore spacings that can be used as templates for the assembly of semiconductor nanowire arrays. Silicon and germanium nanowires, with size monodisperse diameters, can readily be formed within the mesoporous silica matrix using a supercritical fluid inclusion technique. These nano-composite materials display unique optical properties such as intense room temperature ultraviolet and visible photoluminescence. The implication of these mesoporous nanowire materials for future electronic and opto-electronic devices is discussed.
引用
收藏
页码:248 / 258
页数:11
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