Life-Stress Relationship for Thin Film Transistor Gate Line Interconnects on Flexible Substrates

被引：0

作者：

Martin, Thomas ^{[1
]}

Christou, Aris ^{[1
]}

机构：

[1] Univ Maryland, College Pk, MD 20742 USA

来源：

OPTOELECTRONIC INTERCONNECTS AND COMPONENT INTEGRATION IX | 2010年 / 7607卷

关键词：

Thin Film Transistor; TFT; flexible electronics; interconnects; stress-life model; OXIDE;

D O I：

10.1117/12.840044

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Change in resistance of interconnect traces on flexible substrates is dependent on material properties and mechanical stress imposed by tensile strain. Dedicated test structures and a mechanical flexing / data collection system were designed and fabricated to collect time to failure data based on cyclic loading to different radii of curvature. We propose a life-stress model based on an inverse power law relationship defining the characteristic life of a Weibull life distribution.

引用

页数：9

共 10 条

[1]

Bouton P.C., 2002, Proceedings of Eurodisplay, P313

[2] Strain-dependent electrical resistance of tin-doped indium oxide on polymer substrates [J].

Cairns, DR ;

Witte, RP ;

Sparacin, DK ;

Sachsman, SM ;

Paine, DC ;

Crawford, GP ;

Newton, RR .

APPLIED PHYSICS LETTERS, 2000, 76 (11) :1425-1427

[3]

CHENG IC, 2004, UNPUB

[4] Thin film encapsulated flexible organic electroluminescent displays [J].

Chwang, AB ;

Rothman, MA ;

Mao, SY ;

Hewitt, RH ;

Weaver, MS ;

Silvernail, JA ;

Rajan, K ;

Hack, M ;

Brown, JJ ;

Chu, X ;

Moro, L ;

Krajewski, T ;

Rutherford, N .

APPLIED PHYSICS LETTERS, 2003, 83 (03) :413-415

[5]

Crawford GP, 2005, WILEY-SID SER DISPL, P1, DOI 10.1002/0470870508

[6]

Gorkhali S. P., 2004, Journal of the Society for Information Display, V12, P45, DOI 10.1889/1.1824238

[7] Fatigue in thin films: lifetime and damage formation [J].

Kraft, O ;

Schwaiger, R ;

Wellner, P .

MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2001, 319 :919-923

[8] Mechanical integrity of transparent conductive oxide films for flexible polymer-based displays [J].

Leterrier, Y ;

Médico, L ;

Demarco, F ;

Månson, JAE ;

Betz, U ;

Escolà, MF ;

Olsson, MK ;

Atamny, F .

THIN SOLID FILMS, 2004, 460 (1-2) :156-166

[9]

MODARRES M, 1999, RELIABILITY ENG RISK, P76

[10] Mechanical stability of externally deformed indium-tin-oxide films on polymer substrates [J].

Park, SK ;

Han, JI ;

Moon, DG ;

Kim, WK .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2003, 42 (2A) :623-629

← 1 →