Site-controlled SiGe islands on patterned Si(001): Morphology, composition profiles, and devices

被引:3
作者
Zhang, Jianjun [1 ]
Rastelli, Armando [1 ]
Schmidt, Oliver G. [1 ]
Bauer, Guenther [2 ]
机构
[1] IFW Dresden, Inst Integrat Nanosci, D-01069 Dresden, Germany
[2] Univ Linz, Inst Semicond & Solid State Phys, A-4040 Linz, Austria
来源
PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS | 2012年 / 249卷 / 04期
关键词
composition; morphology; ordered islands; silicon-germanium; ASSEMBLED GE ISLANDS; QUANTUM DOTS; STRAIN; NANOCRYSTALS; GROWTH; TRANSISTORS; TRANSITION; EVOLUTION; PYRAMIDS; SI1-XGEX;
D O I
10.1002/pssb.201100771
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Deterministic control of position on a substrate, uniform size and shape are prerequisite for most of the envisioned applications of SiGe islands in electronic and optoelectronic devices. As an example of electronic application, tensile strained Si layers on top of coherent SiGe islands may be used as channels for field effect transistors (FETs) with enhanced electron mobility. For such a kind of application, site-controlled islands are required to allow for their external addressability. In this feature article we investigate the morphological and compositional evolution of site-controlled SiGe islands on pit-patterned Si(001) substrates. We then report on the first demonstrated n-channel FET with enhanced electron mobility based on SiGe islands. Finally, a new approach for further increase of the tensile strain is presented.
引用
收藏
页码:752 / 763
页数:12
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