Magnetic anisotropy and stacking faults in Co and Co84Pt16 epitaxially grown thin films

被引：17

作者：

Sokalski, Vincent ^{[1
]}

Laughlin, David E. ^{[1
]}

Zhu, Jian-Gang ^{[1
]}

机构：

[1] Carnegie Mellon Univ, Ctr Data Storage Syst, Pittsburgh, PA 15213 USA

来源：

JOURNAL OF APPLIED PHYSICS | 2011年 / 110卷 / 09期

基金：

美国安德鲁·梅隆基金会;

关键词：

ALLOY; MEDIA; CO3PT;

D O I：

10.1063/1.3658861

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A combined set of experimental and theoretical diffraction studies are performed to evaluate the possible impact of stacking faults on magnetic anisotropy using epitaxially grown Co/Ru and Co84Pt16/Ru thin films on MgO(111) single crystal substrates. A 3rd nearest neighbor interaction is incorporated into Monte Carlo simulations of faulted film growth used to predict (10.L) diffraction profiles. These are compared with experimental profiles to determine stacking fault content. It is found that stacking fault density decreases with increasing temperature concurrent with an increase in magnetic anisotropy and a compression of the crystallographic lattice parameter, c. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3658861]

引用

页数：6

共 24 条

[1]

[Anonymous], 2000, Modern Magnetic Materials: Principles and Applications

[2]

Birkholz M, 2006, THIN FILM ANALYSIS BY X-RAY SCATTERING, P1

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