Influence of doping rate in Er3+: ZnO films on emission characteristics

被引:26
作者
Douglas, L. [1 ]
Mundle, R. [1 ]
Konda, R. [1 ]
Bonner, C. E. [1 ]
Pradhan, A. K. [1 ]
Sahu, D. R. [2 ]
Huang, J-L. [2 ]
机构
[1] Norfolk State Univ, Mat Res Ctr, Norfolk, VA 23504 USA
[2] Natl Cheng Kung Univ, Dept Mat Sci & Engn, Tainan 701, Taiwan
关键词
D O I
10.1364/OL.33.000815
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
High-quality Er3+ : ZnO films were grown by the pulsed-laser deposition technique for 0.5 and 2 wt. % Er doping. Two peaks were observed at approximately 1.54 mu m in the photoluminescence spectra of samples with 2 wt. % doping contrary to only one peak in the 0.5 wt. % doped sample. Both peaks were found to be strongly temperature dependent. The microscopic studies clearly illustrate that the appearance of the additional peak is attributed to the environment of Er3+ ions in the form of ErO6 clusters, which are optically active centers in the ZnO matrix. These results are very important for designing waveguides for telecommunications. (C) 2008 Optical Society of America.
引用
收藏
页码:815 / 817
页数:3
相关论文
共 8 条
  • [1] Local structure analysis of an optically active center in Er-doped ZnO thin film
    Ishii, M
    Komuro, S
    Morikawa, T
    Aoyagi, Y
    [J]. JOURNAL OF APPLIED PHYSICS, 2001, 89 (07) : 3679 - 3684
  • [2] Photoluminescence and excitation spectroscopy of the 1.5 μm Er-related band in MBE-grown GaN layers
    Izeddin, I
    Gregorkiewicz, T
    Lee, DS
    Steckl, AJ
    [J]. SUPERLATTICES AND MICROSTRUCTURES, 2004, 36 (4-6) : 701 - 705
  • [3] Excitation and deexcitation of Er3+ in crystalline silicon
    Kik, PG
    deDood, MJA
    Kikoin, K
    Polman, A
    [J]. APPLIED PHYSICS LETTERS, 1997, 70 (13) : 1721 - 1723
  • [4] 1.54 μm emission dynamics of erbium-doped zinc-oxide thin films
    Komuro, S
    Katsumata, T
    Morikawa, T
    Zhao, X
    Isshiki, H
    Aoyagi, Y
    [J]. APPLIED PHYSICS LETTERS, 2000, 76 (26) : 3935 - 3937
  • [5] Er doped nanocrystalline ZnO planar waveguide structures for 1.55 μm amplifier applications
    Mais, N
    Reithmaier, JP
    Forchel, A
    Kohls, M
    Spanhel, L
    Müller, G
    [J]. APPLIED PHYSICS LETTERS, 1999, 75 (14) : 2005 - 2007
  • [6] Erbium implanted thin film photonic materials
    Polman, A
    [J]. JOURNAL OF APPLIED PHYSICS, 1997, 82 (01) : 1 - 39
  • [7] Pulsed-laser deposited Er:ZnO films for 1.54 μm emission
    Pradhan, A. K.
    Douglas, L.
    Mustafa, H.
    Mundle, R.
    Hunter, D.
    Bonner, C. E.
    [J]. APPLIED PHYSICS LETTERS, 2007, 90 (07)
  • [8] Activation of 1.54 μm Er3+ fluorescence in concentrated II-VI semiconductor cluster environments
    Schmidt, T
    Muller, G
    Spanhel, L
    Kerkel, K
    Forchel, A
    [J]. CHEMISTRY OF MATERIALS, 1998, 10 (01) : 65 - 71