Effect of Complexing Agents on Structural, Morphological, and Optical Properties of Chemically Deposited ZnO Thin Films

被引:0
作者
Raidou, A. [1 ]
机构
[1] Ibn Tofail Univ, Fac Sci, Dept Phys, Mat & Subat Phys Lab, BP 133, Kenitra 14000, Morocco
关键词
thin films; ZnO; complexing agents; SILAR method; semiconductors; IONIC LAYER ADSORPTION; ELECTRICAL-PROPERTIES; FABRICATION; NANORODS; GROWTH; SENSOR;
D O I
10.1134/S1063782621080157
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Two ZnO thin films have been chemically elaborated on glass substrates by successive ionic layer adsorption and reaction method using two different complexing agents, ammonia and ammonium hydroxide. X-ray diffraction study confirmed the hexagonal wurtzite structure for both films that are polycrystalline with preferential direction (002). Scanning electron microscopy showed an agglomeration of small grains throughout the substrate surfaces, with morphological changes and the existence of an uncovered part of substrates. The film prepared using NH4OH showed a higher transmittance. The optical band gap values for the films are close to 3.36 and 3.33 eV, respectively.
引用
收藏
页码:691 / 695
页数:5
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