Scaling Effects in Perovskite Ferroelectrics: Fundamental Limits and Process-Structure-Property Relations

被引:185
作者
Ihlefeld, Jon F. [1 ]
Harris, David T. [2 ,4 ]
Keech, Ryan [3 ]
Jones, Jacob L. [2 ]
Maria, Jon-Paul [2 ]
Trolier-McKinstry, Susan [3 ]
机构
[1] Sandia Natl Labs, Elect Opt & Nano Mat Dept, POB 5800, Albuquerque, NM 87185 USA
[2] North Carolina State Univ, Dept Mat Sci & Engn, Box 7907, Raleigh, NC 27695 USA
[3] Penn State Univ, Dept Mat Sci & Engn, University Pk, PA 16802 USA
[4] Univ Wisconsin, Dept Mat Sci & Engn, 1509 Univ Ave, Madison, WI 53706 USA
基金
美国国家科学基金会;
关键词
ferroelectricity/ferroelectric materials; thin films; grain size; (BA; SR)TIO3; THIN-FILMS; POSITIVE TEMPERATURE-COEFFICIENT; NANOCRYSTALLINE BARIUM-TITANATE; MULTILAYER CERAMIC CAPACITORS; MISFIT RELAXATION MECHANISMS; MORPHOTROPIC-PHASE-BOUNDARY; DOMAIN-WALL MOTION; CURIE-WEISS LAW; DIELECTRIC-PROPERTIES; GRAIN-SIZE;
D O I
10.1111/jace.14387
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Ferroelectric materials are well-suited for a variety of applications because they can offer a combination of high performance and scaled integration. Examples of note include piezoelectrics to transform between electrical and mechanical energies, capacitors used to store charge, electro-optic devices, and nonvolatile memory storage. Accordingly, they are widely used as sensors, actuators, energy storage, and memory components, ultrasonic devices, and in consumer electronics products. Because these functional properties arise from a noncentrosymmetric crystal structure with spontaneous strain and a permanent electric dipole, the properties depend upon physical and electrical boundary conditions, and consequently, physical dimension. The change in properties with decreasing physical dimension is commonly referred to as a size effect. In thin films, size effects are widely observed, whereas in bulk ceramics, changes in properties from the values of large-grained specimens is most notable in samples with grain sizes below several micrometers. It is important to note that ferroelectricity typically persists to length scales of about 10 nm, but below this point is often absent. Despite the stability of ferroelectricity for dimensions greater than similar to 10 nm, the dielectric and piezoelectric coefficients of scaled ferroelectrics are suppressed relative to their bulk counterparts, in some cases by changes up to 80%. The loss of extrinsic contributions (domain and phase boundary motion) to the electromechanical response accounts for much of this suppression. In this article, the current understanding of the underlying mechanisms for this behavior in perovskite ferroelectrics is reviewed. We focus on the intrinsic limits of ferroelectric response, the roles of electrical and mechanical boundary conditions, grain size and thickness effects, and extraneous effects related to processing. In many cases, multiple mechanisms combine to produce the observed scaling effects.
引用
收藏
页码:2537 / 2557
页数:21
相关论文
共 266 条
[1]  
Agar JC, 2016, NAT MATER, V15, P549, DOI [10.1038/nmat4567, 10.1038/NMAT4567]
[2]   Complex Evolution of Built-in Potential in Compositionally-Graded PbZr1-xTixO3 Thin Films [J].
Agar, Joshua C. ;
Damodaran, Anoop R. ;
Velarde, Gabriel A. ;
Pandya, Shishir ;
Mangalam, R. V. K. ;
Martin, Lane W. .
ACS NANO, 2015, 9 (07) :7332-7342
[3]   Size dependence of domain patterns in a constrained ferroelectric system [J].
Ahluwalia, R ;
Cao, WW .
JOURNAL OF APPLIED PHYSICS, 2001, 89 (12) :8105-8109
[4]   POSSIBLE SPECIES OF FERROELASTIC CRYSTALS AND OF SIMULTANEOUSLY FERROELECTRIC AND FERROELASTIC CRYSTALS [J].
AIZU, K .
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1969, 27 (02) :387-&
[5]   Size effect in morphotropic phase boundary Pb(Mg1/3Nb2/3)O3-PbTiO3 [J].
Alguero, M. ;
Ricote, J. ;
Jimenez, R. ;
Ramos, P. ;
Carreaud, J. ;
Dkhil, B. ;
Kiat, J. M. ;
Holc, J. ;
Kosec, M. .
APPLIED PHYSICS LETTERS, 2007, 91 (11)
[6]   Can interface dislocations degrade ferroelectric properties? [J].
Alpay, SP ;
Misirlioglu, IB ;
Nagarajan, V ;
Ramesh, R .
APPLIED PHYSICS LETTERS, 2004, 85 (11) :2044-2046
[7]   Thickness dependence of structure and piezoelectric properties at nanoscale of polycrystalline lead zirconate titanate thin films [J].
Araujo, E. B. ;
Lima, E. C. ;
Bdikin, I. K. ;
Kholkin, A. L. .
JOURNAL OF APPLIED PHYSICS, 2013, 113 (18)
[8]   DIELECTRIC-PROPERTIES OF FINE-GRAINED BARIUM-TITANATE CERAMICS [J].
ARLT, G ;
HENNINGS, D ;
DEWITH, G .
JOURNAL OF APPLIED PHYSICS, 1985, 58 (04) :1619-1625
[9]   Permittivity scaling in Ba1-xSrxTiO3 thin films and ceramics [J].
Ayguen, Seymen M. ;
Ihlefeld, Jon F. ;
Borland, William J. ;
Maria, Jon-Paul .
JOURNAL OF APPLIED PHYSICS, 2011, 109 (03)
[10]   In situ methods to explore microstructure evolution in chemically derived oxide thin films [J].
Aygun, Seymen M. ;
Daniels, Patrick ;
Borland, William J. ;
Maria, Jon-Paul .
JOURNAL OF MATERIALS RESEARCH, 2010, 25 (03) :427-436