Tracking advances in pulsed S-parameter measurements

被引：0
|
作者：
Betts, Loren [1 ]
机构：
[1] Agilent Technol, Santa Rosa, CA 95403 USA
来源：
MICROWAVES & RF | 2007年 / 46卷 / 09期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A high-performance microwave vector network analyzer employs a number of hardware- and software-based advances to improve the accuracy of narrowband pulsed S-parameter measurements.
引用
收藏
页码：61 / +
页数：7
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