Ridge-geometry InGaN multi-quantum-well-structure laser diodes

被引:176
作者
Nakamura, S
Senoh, M
Nagahama, S
Iwasa, N
Yamada, T
Matsushita, T
Sugimoto, Y
Kiyoku, H
机构
[1] Dept. of Research and Development, Nichia Chemical Industries, Ltd., Anan, Tokushima 774, 491 Oka, Kaminaka
关键词
D O I
10.1063/1.116913
中图分类号
O59 [应用物理学];
学科分类号
摘要
Stripe- and ridge-geometry in InGaN multi-quantum-well (MQW)-structure laser diodes (LDs) were fabricated on sapphire substrates with (<11(2)over bar 0>) orientation (A face). The ridge-geometry InGaN MQW LDs showed strong stimulated emission at a wavelength of 411.3 nm under a pulsed current injection of 199 mA at room temperature, The differential quantum efficiency per facet and the threshold current of ridge-geometry LDs were 30% and 180 mA, respectively. The laser threshold current density was 3 kA/cm(2), These values were greatly improved in comparison to those of stripe-geometry LDs, The characteristic temperature of the threshold current was around 185 K. (C) 1996 American Institute of Physics.
引用
收藏
页码:1477 / 1479
页数:3
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