Integrated piezoresistive position detection for electrostatic driven micro scanning mirrors

被引:9
作者
Grahmann, Jan [1 ]
Grasshoff, Thomas [1 ]
Conrad, Holger [1 ]
Sandner, Thilo [1 ]
Schenk, Harald [1 ]
机构
[1] Fraunhofer Inst Photon Microsyst IPMS, D-01109 Dresden, Germany
来源
MOEMS AND MINIATURIZED SYSTEMS X | 2011年 / 7930卷
关键词
MOEMS; scanning micromirror; piezoresistive; position sensor; angular sensor; optical SOI-MEMS;
D O I
10.1117/12.874979
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We have been developing a piezoresistive position detection for scanning micro mirrors in order to combine high position resolution with the capability of monolithic integration. In comparison to our formerly published results, the sensor sensitivity was strongly enhanced by implanting a 1 mu m thick p-doped layer of NA approximate to 10(17) cm(-3) into the lowly p-doped SOI device layer of NA approximate to 10(15) cm(-3). This sensitivity was even further improved by at least a factor of 3 by a novel sensor design, allowing to couple more mechanical stress into the sensor structure.
引用
收藏
页数:8
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