Cantilever flexure, adhesive/attractive and lateral force measurements on highly-oriented pyrolytic graphite by scanning force microscopy

被引:5
|
作者
Mechler, A
Heszler, P
Reimann, CT
Revesz, K
Bor, Z
机构
[1] JATE Univ, Dept Opt & Quantum Elect, H-6701 Szeged, Hungary
[2] Hungarian Acad Sci, Res Grp Laser Phys, H-6701 Szeged, Hungary
[3] Univ Uppsala, Dept Radiat Sci, Div Ion Phys, S-75121 Uppsala, Sweden
[4] Hungarian Acad Sci, Inst Nucl Res, H-4001 Debrecen, Hungary
基金
匈牙利科学研究基金会; 瑞典研究理事会;
关键词
D O I
10.1016/S0042-207X(98)00054-2
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Pre-existing defects in the surface of highly-oriented pyrolytic graphite (HOPG) can be etched out by reaction with oxygen at high temperature. The result of this treatment is a population of one-monolayer-deep etch pits on the surface. An etch pit edge, possessing different chemical terminations than the basal plane of HOPG, may display unique interactions with any nanometer-scale material entity (viz. clusters and molecules) located in its vicinity Since probe tips used in scanning force microscopy (SFM) can possess radii of curvature as small as 5-10 nm, it might be possible to measure the chemical uniqueness of etch pit edges with the help of SFM. In this paper, we consider possible instrumental artefacts which could hinder SPM studies of topography and friction on tailored HOPG surfaces for which there is a spatial variation in chemical properties. We conclude by discussing evidence for enhanced friction (approximate to 100%) and adhesion (approximate to 20%) at etch pit edges. (C) 1998 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:281 / 287
页数:7
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