High resolution curvature sensing

被引:0
作者
Pinchasi, SV [1 ]
Ribak, EN [1 ]
机构
[1] Technion Israel Inst Technol, Dept Phys, IL-32000 Haifa, Israel
来源
HIGH-RESOLUTION WAVEFRONT CONTROL: METHODS, DEVICES, AND APPLICATIONS II | 2000年 / 4124卷
关键词
curvature sensing; deformable mirror; TIE; porous silicon;
D O I
10.1117/12.407493
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Curvature sensing is a non-interferometric wave front sensing method. Its resolution is only limited by the sensor resolution and it only requires one pixel for each point. In order to understand its applicability it was tested in a controlled laboratory environment. We tried various optical configurations and different data processing methods, such as Projection on convex sets and finite elements. In edition it is presented that a simple silicon wafer, on the back of which porous silicon is etched, can serve as deformable mirror. This is the first report, to our knowledge, of the piezoelectric and piezooptic response of porous silicon.
引用
收藏
页码:110 / 117
页数:8
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