Estimation of low temperature characteristics of JFETs from their room-temperature characteristics

被引：5

作者：

Sreelakshmi, K

Satyam, M

机构：

[1] Devices Laboratory, Dept. of Elec. Commun. Engineering, Indian Institute of Science

来源：

CRYOGENICS | 1996年 / 36卷 / 05期

关键词：

low temperature; JFETs; characteristics; room temperature;

D O I：

10.1016/0011-2275(96)81102-7

中图分类号：

O414.1 [热力学];

学科分类号：

摘要：

This paper describes the measured electrical characteristics of JFETs in the temperature range from 300 K to 20 K. Also explained is an attempt to compute these characteristics at any temperature lower than 300 K knowing the characteristics at room temperature.

引用

页码：325 / 331

页数：7

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