Estimation of low temperature characteristics of JFETs from their room-temperature characteristics

被引：5
|
作者：
Sreelakshmi, K
Satyam, M
机构：
[1] Devices Laboratory, Dept. of Elec. Commun. Engineering, Indian Institute of Science
来源：
CRYOGENICS | 1996年 / 36卷 / 05期
关键词：
low temperature; JFETs; characteristics; room temperature;
D O I：
10.1016/0011-2275(96)81102-7
中图分类号：
O414.1 [热力学];
学科分类号：
摘要：
This paper describes the measured electrical characteristics of JFETs in the temperature range from 300 K to 20 K. Also explained is an attempt to compute these characteristics at any temperature lower than 300 K knowing the characteristics at room temperature.
引用
收藏
页码：325 / 331
页数：7
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