Accuracy improvements in microwave noise parameter determination

被引：2

作者：

Schmatz, ML ^{[1
]}

Benedickter, HR ^{[1
]}

机构：

[1] ETH Zurich, Lab EM Fields & Microwave Elect, CH-8092 Zurich, Switzerland

来源：

51ST ARFTG CONFERENCE DIGEST | 1998年

关键词：

D O I：

10.1109/ARFTG.1998.327278

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

An improved method for the determination of noise parameters from several noise figure measurements on arbitrary source reflections is presented. By applying a transformation algorithm to the measured data, the influence of measurement errors is substantially reduced. The straight forward method needs no iterative estimation of the noise parameters. Synthetic measurements with random measurement errors associated to the measured noise figures as well as to the measured source reflection coefficients were investigated. It is shown, that the magnitude of the source reflection coefficients used for noise figure measurements should be smaller than 0.8, regardless of the magnitude of the optimum noise source reflection coefficient. The new determination method was implemented in a commercial noise parameter system where the measurement capabilities for small transistors was improved considerably.

引用

页码：62 / 64

页数：3

共 12 条

[1]

ADAMIAN V, 1991, Patent No. 5034708

[2]

BAILEY AE, 1989, MICROWAVE MEASUREMEN, P176

[3]

BIBER C, IN PRESS 1998 IEEE M

[4]

CARUSO G, 1978, IEEE T MICROW THEORY, V26, P639

[5] ACCURACY IMPROVEMENTS IN MICROWAVE NOISE PARAMETER MEASUREMENTS [J].

DAVIDSON, AC ;

LEAKE, BW ;

STRID, E .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1989, 37 (12) :1973-1978

[6] DETERMINATION OF DEVICE NOISE PARAMETERS [J].

LANE, RQ .

PROCEEDINGS OF THE IEEE, 1969, 57 (08) :1461-&

[7]

*MAUR MICR CORP, TUN COAX SLID SCREW

[8] IMPROVED COMPUTATIONAL METHOD FOR NOISE PARAMETER MEASUREMENT [J].

MITAMA, M ;

KATOH, H .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1979, 27 (06) :612-615

[9]

PRESS WH, 1992, NUMERICAL RECIPES C, P676

[10] DETERMINATION OF DEVICE NOISE AND GAIN PARAMETERS [J].

SANNINO, M .

PROCEEDINGS OF THE IEEE, 1979, 67 (09) :1364-1366

← 1 2 →