Evaluation of Surface-Enhanced Raman Spectroscopy Substrates from Single-Molecule Statistics

被引：12
作者：
Kiefl, Evan J. [1 ]
Kiefl, Robert F. [2 ]
dos Santos, Diego P. [3 ]
Brolo, Alexandre G. [1 ,4 ]
机构：
[1] Univ Victoria, Dept Chem, Victoria, BC V8P 5C2, Canada
[2] Univ British Columbia, Dept Phys & Astron, Vancouver, BC V6T 1Z4, Canada
[3] Univ Estadual Campinas, Inst Chem, Dept Phys Chem, BR-13083970 Sao Paulo, Brazil
[4] Univ Victoria, Ctr Adv Mat & Related Technol CAMTEC, Victoria, BC V8W 2Y2, Canada
来源：
JOURNAL OF PHYSICAL CHEMISTRY C | 2017年 / 121卷 / 45期
基金：
加拿大自然科学与工程研究理事会;
关键词：
DISCRETE-DIPOLE APPROXIMATION; ELECTROMAGNETIC SCATTERING; HOT-SPOTS; SERS; AGGREGATE; SPHERES; FABRICATION; ADSORPTION; CHALLENGES; FUTURE;
D O I：
10.1021/acs.jpcc.7b08691
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Accurate quantification of substrate characteristics is a central pursuit within the field of surface-enhanced Raman spectroscopy (SERS). A theory based on single-molecule SERS (SM-SERS) statistics was developed for comprehensive substrate evaluation. This approach is applicable to general substrates possessing many hotspots and is capable of quantifying hotspot strength variation using a minimal set of fitting parameters. The model was validated for simulated substrates and then applied to the SM-SERS statistics of a roughened silver electrode, for which the degree of hotspot uniformity was quantified. The fitted model parameters provide important information concerning the structure activity relationship of hotspots and can be used to directly compare SERS substrates. Overall, our results present an experimentally determinable parameter set that potentially improves upon the widely used "average enhancement factor" metric currently used for SERS substrate evaluation.
引用
收藏
页码：25487 / 25493
页数：7
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