Interfacial reactions in the Sn-Ag/Au couples

被引:45
作者
Chen, SW [1 ]
Yen, YW [1 ]
机构
[1] Natl Tsing Hua Univ, Dept Chem Engn, Hsinchu 300, Taiwan
关键词
Sn-Ag/Cu couples; interfacial reactions; lead-free solder;
D O I
10.1007/s11664-001-0140-x
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Ag-Sn alloys are one of the most promising lead-free solders. Their reactions with Au substrates have been examined by using the reaction couple technique. Sn3.5wt.%Ag/Au and Sn-25wt.%Ag/Au couples have been prepared and reacted at 120, 150, 180 and 200 degreesC for various lengths of time. Three phases, delta -AuSn, is an element of (2)-AuSn2, and eta -AuSn4, are found in all the couples. The thickness of the reaction layers increases with higher temperatures and longer reaction time, and their growth rates are described by using the parabolic law. Arrhenius equation is used to describe the temperature dependence of the growth rates. The activation energy of the growth of the intermetallic layers in both kinds of the reaction couples is similar and is determined to be 76.74 KJ/mole. Based on the reaction path knowledge and interfacial morphology, it is concluded that Sn is the fastest diffusion species in the couples.
引用
收藏
页码:1133 / 1137
页数:5
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