Synthetic ZrSiO4 and (mildly to strongly radiation-damaged) natural zircon samples were irradiated with 8.8 MeV He-4(2+) ions (fluences in the range 1 x 10(13)-5 x 10(16) ions/cm(2)). For comparison, an additional irradiation experiment was done with 30 MeV O-16(6+) ions (fluence 1 x 10(15) ions/cm(2)). The light-ion irradiation resulted in the generation of new (synthetic ZrSiO4) or additional (mildly to strongly metamict natural samples) damage. The maximum extent of the damage is observed in a shallow depth range approximately 32-33 mu m (8.8 MeV He) and similar to 12 mu m (30 MeV O) below the sample surface, i.e. near the end of the ion trajectories. These depth values, and the observed damage distribution, correspond well to defect distribution patterns as predicted by Monte Carlo simulations. The irradiation damage is recognised from the notable broadening of Raman-active vibrational modes, lowered interference colours (i.e. decreased birefringence), and changes in the optical activity (i.e. luminescence emission). At very low damage levels, a broad-band yellow emission centre is generated whereas at elevated damage levels, this centre is suppressed and samples experience a general decrease in their emission intensity. Most remarkably, there is no indication of notable structural recovery in pre-damaged natural zircon as induced by the light-ion irradiation, which questions the relevance of alpha-assisted annealing of radiation damage in natural zircon.