Test Compression Using Extended Nonlinear Binary Codes

被引：0

作者：

Novak, Ondrej ^{[1
]}

机构：

[1] Tech Univ Liberec, Inst Informat Technol & Elect, Liberec, Czech Republic

来源：

2018 IEEE 24TH INTERNATIONAL SYMPOSIUM ON ON-LINE TESTING AND ROBUST SYSTEM DESIGN (IOLTS 2018) | 2018年

关键词：

BIST; design for testability; test vector compression technique; pseudo-exhaustive testing; binary codes;

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

The linear binary codes can be extended by a relatively high number of nonlinear check bits in such a way that the code words preserve the value of the maximum number of independently specified bits from the original linear code words. A substantial improvement can be achieved in the field of sequential pattern compression using these nonlinear codes. The number of scan chains loaded in parallel can be increased while the number of specified bits is kept. We propose an algorithm that finds the appropriate nonlinear modification circuit structure and verifies the test pattern quality for different numbers of care bits in a test pattern.

引用

页码：255 / 256

页数：2