Electric-field scanning system using electro-optic sensor

被引:0
|
作者
Sasaki, A [1 ]
Nagatsuma, T [1 ]
机构
[1] NTT Corp, Microsyst Integrat Labs, Atsugi, Kanagawa 2430198, Japan
关键词
millimeter wave; electric field; imaging; scanner; electro-optic crystal;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
To perform a high-speed measurement of a two-dimensional electric-field distribution, we developed an electric-field scanning system using a large-aperture electro-optic crystal and a laser-beam scanner. In the system, a two-dimensional electric-field image projected onto the crystal is read off using beam scanning through an electro-optic effect. With the imaging system, only 20 to 40 seconds are needed to obtain both millimeter-wave amplitude and phase images of a 20 x 30 mm area with a pixel spacing of 0.5 mm. We measured radiation patterns of a 10-GHz dipole antenna and compared them with simulation results to investigate a disturbance of the patterns inside the crystal. Profiles of a 120-GHz millimeter-wave beam were also measured to determine the effects of a dielectric lens used to focus the beam. Furthermore, we applied the system to imaging several objects with 180-GHz millimeter waves and experimentally showed that it is a valid means for a non-destructive inspection of hidden objects.
引用
收藏
页码:1345 / 1351
页数:7
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