Compound Poisson Noise Verification for X-ray Flat Panel Imager

被引：0

作者：

Hsieh, Ho-Hui ^{[1
]}

Ni, Yu-Ching ^{[1
]}

Tseng, Sheng-Pin ^{[1
]}

Tseng, Fan-Pin ^{[1
]}

Chen, Liang-Cheng ^{[1
]}

机构：

[1] Inst Nucl Energy Res, Div Hlth Phys, Taoyuan, Taiwan

来源：

2015 IEEE INTERNATIONAL CONFERENCE ON IMAGING SYSTEMS AND TECHNIQUES (IST) PROCEEDINGS | 2015年

关键词：

radiography; x-ray detectors; noise; ENERGY-INTEGRATING DETECTORS; RECONSTRUCTION; PERFORMANCE;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Physical effects that contribute to the noise in digital radiography are possible to be represented as overall variance including Poisson statistics of x-rays. For real system, statement of the noise response must be integrated against a spectrum to get the total response to spectral fluence of x-ray, that the detected x-ray follows a compound-Poisson distribution. To verify the noise property of our x-ray flat-panel detector (FPD), we formulate a compound-Poisson based model to verify the image noise statistic from measured data. Results demonstrate that the FPD noise property is independed from the tube voltage; only 1.6% error is occurred by the model fitting. In this case, the noise property of our FPD can accurately be represented as the modeled function.

引用

页码：422 / 426

页数：5

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