Nanostructure of buried interface layers in TiO2 anatase thin films grown on LaAlO3 and SrTiO3 substrates

被引：23

作者：

Ciancio, Regina ^{[1
]}

Carlino, Elvio ^{[1
]}

Aruta, Carmela ^{[2
,3
]}

Maccariello, Davide ^{[2
,3
]}

Granozio, Fabio Miletto ^{[2
,3
]}

di Uccio, Umberto Scotti ^{[2
,3
]}

机构：

[1] CNR IOM TASC, I-34149 Trieste, Italy

[2] Complesso Univ Monte SantAngelo, CNR SPIN, I-80126 Naples, Italy

[3] Complesso Univ Monte SantAngelo, Dipartimento Sci Fis, I-80126 Naples, Italy

来源：

NANOSCALE | 2012年 / 4卷 / 01期

关键词：

MOLECULAR-BEAM EPITAXY; YBCO;

D O I：

10.1039/c1nr11015b

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

TiO2 anatase thin films grown by pulsed laser deposition are investigated by high resolution transmission electron microscopy and high angle annular dark field scanning transmission electron microscopy. The analyses provide evidence of a peculiar growth mode of anatase on LaAlO3 and SrTiO3 characterized by the formation of an epitaxial layer at the film/substrate interface, due to cationic diffusion from the substrate into the film region. Pure TiO2 anatase growth occurs in both specimens above a critical thickness of about 20 nm. The microstructural and chemical characterization of the samples is presented and discussed in the framework of oxide interface engineering.

引用

页码：91 / 94

页数：4

共 23 条

[1] ELECTRON-OPTICAL IMAGING OF TI6O11 AT 1.6 A POINT-TO-POINT RESOLUTION [J].