Wide-Range-Tunable p-Type Conductivity of Transparent CuI1-xBrxAlloy

被引:33
作者
Yamada, Naoomi [1 ]
Tanida, Yuta [1 ]
Murata, Hidenobu [2 ]
Kondo, Takahiro [1 ]
Yoshida, Shougo [1 ]
机构
[1] Chubu Univ, Dept Appl Chem, 1200 Matsumoto, Kasugai, Aichi 4878501, Japan
[2] Osaka Prefecture Univ, Dept Mat Sci, Naka Ku, 1-1 Gakuencho, Sakai, Osaka 5998531, Japan
关键词
alloys; cuprous halide; hole concentration tunability; p-type transparent semiconductors; transparent p-n diodes; X-RAY PHOTOELECTRON; IODIDE THIN-FILM; OPTICAL-PROPERTIES; ELECTRICAL-CONDUCTION; LOW-TEMPERATURE; CUI; OXIDE; CUBR; DEPOSITION; CRYSTALS;
D O I
10.1002/adfm.202003096
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Transparent p-type semiconductors with wide-range tunability of the hole density are rare. Developing such materials is a challenge in the field of transparent electronics that utilize invisible electric circuits. In this paper, a CuI-CuBr alloy (CuI1-xBrx) is proposed as a hole-density-tunable p-type transparent semiconductor that can be fabricated at room temperature. First-principles calculations predict that the acceptor state originating from copper vacancies in CuBr is deeper than that in CuI, leading to the hypothesis that the hole density in CuI(1-)(x)Br(x)can be tuned over a wide range by varyingxbetween 0 and 1. The experimental results support this hypothesis. The hole density in CuI(1-)(x)Br(x)polycrystalline alloy layers can be tuned by over three orders of magnitude (10(17)-10(20)cm(-3)) by varyingx. In other words, the p-type conductivity of the CuI(1-)(x)Br(x)alloy shows metallic and semiconducting properties. Such alloy layers can be prepared at room temperature without sacrificing transparency. Furthermore, CuI(1-)(x)Br(x)forms transparent p-n diodes with n-type amorphous In-Ga-Zn-O layers, and these diodes have satisfactory rectification performance. Therefore, CuI(1-)(x)Br(x)alloy is an excellent p-type transparent semiconductor for which the p-type conductivity can be tailored in a wide range.
引用
收藏
页数:10
相关论文
共 66 条
[21]   First-principles study of γ-CuI for p-type transparent conducting materials [J].
Huang, Dan ;
Zhao, Yu-Jun ;
Li, Shen ;
Li, Chang-Sheng ;
Nie, Jian-Jun ;
Cai, Xin-Hua ;
Yao, Chun-Mei .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2012, 45 (14)
[22]   CONCERNING POLARIZATION MEASUREMENTS ON MIXED CONDUCTORS [J].
JOSHI, AV ;
WAGNER, JB .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1972, 33 (01) :205-+
[23]   Material Design of p-Type Transparent Amorphous Semiconductor, Cu-Sn-I [J].
Jun, Taehwan ;
Kim, Junghwan ;
Sasase, Masato ;
Hosono, Hideo .
ADVANCED MATERIALS, 2018, 30 (12)
[24]   P-type electrical conduction in transparent thin films of CuAlO2 [J].
Kawazoe, H ;
Yasukawa, M ;
Hyodo, H ;
Kurita, M ;
Yanagi, H ;
Hosono, H .
NATURE, 1997, 389 (6654) :939-942
[25]   Carrier generation in a p-type oxide semiconductor: Sn2(Nb2-xTax)O7 [J].
Kikuchi, Naoto ;
Samizo, Akane ;
Ikeda, Shintaro ;
Aiura, Yoshihiro ;
Mibu, Ko ;
Nishio, Keishi .
PHYSICAL REVIEW MATERIALS, 2017, 1 (02)
[26]   Suppression of Grain Boundary Scattering in Multifunctional p-Type Transparent γ-CuI Thin Films due to Interface Tunneling Currents [J].
Kneiss, Max ;
Yang, Chang ;
Barzola-Quiquia, Jose ;
Benndorf, Gabriele ;
von Wenckstern, Holger ;
Esquinazi, Pablo ;
Lorenz, Michael ;
Grundmann, Marius .
ADVANCED MATERIALS INTERFACES, 2018, 5 (06)
[27]   X-RAY PHOTOELECTRON STUDY OF VALENCE BANDS IN CUPROUS HALIDES [J].
KONO, S ;
ISHII, T ;
SAGAWA, T ;
KOBAYASI, T .
PHYSICAL REVIEW B, 1973, 8 (02) :795-803
[28]   Optical properties of single crystalline copper iodide with native defects: Experimental and density functional theoretical investigation [J].
Koyasu, Satoshi ;
Umezawa, Naoto ;
Yamaguchi, Akira ;
Miyauchi, Masahiro .
JOURNAL OF APPLIED PHYSICS, 2019, 125 (11)
[29]   Efficient iterative schemes for ab initio total-energy calculations using a plane-wave basis set [J].
Kresse, G ;
Furthmuller, J .
PHYSICAL REVIEW B, 1996, 54 (16) :11169-11186
[30]   From ultrasoft pseudopotentials to the projector augmented-wave method [J].
Kresse, G ;
Joubert, D .
PHYSICAL REVIEW B, 1999, 59 (03) :1758-1775