Direct on Chip Thermal Measurement in IGBT Modules Using FBG Technology-Sensing Head Interfacing

被引:14
作者
Chen, Shiying [1 ]
Vilchis-Rodriguez, Damian [1 ]
Djurovic, Sinisa [1 ]
Barnes, Mike [1 ]
Mckeever, Paul [2 ]
Jia, Chunjiang [2 ]
机构
[1] Univ Manchester, Dept Elect & Elect Engn, Manchester M13 9PL, Lancs, England
[2] Offshore Renewable Energy ORE Catapult, Newcastle Upon Tyne NE24 1LZ, Tyne & Wear, England
关键词
Insulated gate bipolar transistors; Temperature sensors; Temperature measurement; Fiber gratings; Optical fiber sensors; Junctions; Load modeling; FBG; IGBT; thermal sensing; in-situ sensing; optical-fiber; MODEL; CONVERTERS; FAILURE; SENSOR;
D O I
10.1109/JSEN.2021.3131322
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper assesses the suitability of the use of Fiber Bragg Grating Sensors for effective in-situ sensing of the IGBT junction temperature. To this end, the optical sensor is installed on the chip surface in a commercial IGBT module, enabling direct reading of its junction temperature. Two sensor interfacing configurations are evaluated by means of Finite Element simulations and experiments on a purpose designed laboratory test system. Experiments show the feasibility on the use of FBG sensing technology for reliable and effective real-time measurement of the junction temperature in a wide operating envelope of the tested IGBT device.
引用
收藏
页码:1309 / 1320
页数:12
相关论文
共 37 条
  • [1] A Review on IGBT Module Failure Modes and Lifetime Testing
    Abuelnaga, Ahmed
    Narimani, Mehdi
    Bahman, Amir Sajjad
    [J]. IEEE ACCESS, 2021, 9 : 9643 - 9663
  • [2] An Extended Multilayer Thermal Model for Multichip IGBT Modules Considering Thermal Aging
    Akbari, Mohsen
    Bina, Mohammad Tavakoli
    Bahman, Amir Sajjad
    Eskandari, Bahman
    Pouresmaeil, Edris
    Blaabjerg, Frede
    [J]. IEEE ACCESS, 2021, 9 : 84217 - 84230
  • [3] A Failure-Detection Strategy for IGBT Based on Gate-Voltage Behavior Applied to a Motor Drive System
    Antonio Rodriguez-Blanco, Marco
    Claudio-Sanchez, Abraham
    Theilliol, Didier
    Gerardo Vela-Valdes, Luis
    Sibaja-Teran, Pedro
    Hernandez-Gonzalez, Leobardo
    Aguayo-Alquicira, Jesus
    [J]. IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 2011, 58 (05) : 1625 - 1633
  • [4] A Lumped Thermal Model Including Thermal Coupling and Thermal Boundary Conditions for High-Power IGBT Modules
    Bahman, Amir Sajjad
    Ma, Ke
    Blaabjerg, Frede
    [J]. IEEE TRANSACTIONS ON POWER ELECTRONICS, 2018, 33 (03) : 2518 - 2530
  • [5] A 3-D-Lumped Thermal Network Model for Long-Term Load Profiles Analysis in High-Power IGBT Modules
    Bahman, Amir Sajjad
    Ma, Ke
    Ghimire, Pramod
    Iannuzzo, Francesco
    Blaabjerg, Frede
    [J]. IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS, 2016, 4 (03) : 1050 - 1063
  • [6] Thermal characteristics analysis of an IGBT using a fiber Bragg grating
    Bazzo, Joao Paulo
    Lukasievicz, Tiago
    Vogt, Marcio
    de Oliveira, Valmir
    Kalinowski, Hypolito Jose
    Cardozo da Silva, Jean Carlos
    [J]. OPTICS AND LASERS IN ENGINEERING, 2012, 50 (02) : 99 - 103
  • [7] Review of power semiconductor device reliability for power converters
    [J]. 1600, China Power Supply Society (02):
  • [8] An ON-State Voltage Calculation Scheme of MMC Submodule IGBT
    Chen, Shiying
    Ji, Shengchang
    Pan, Liang
    Liu, Chenshuo
    Zhu, Lingyu
    [J]. IEEE TRANSACTIONS ON POWER ELECTRONICS, 2019, 34 (08) : 7996 - 8007
  • [9] Sensitivity enhanced strain and temperature measurements based on FBG and frequency chirp magnification
    Du, Jiangbing
    He, Zuyuan
    [J]. OPTICS EXPRESS, 2013, 21 (22): : 27111 - 27118
  • [10] Dupont L, 2012, APPL POWER ELECT CO, P182, DOI 10.1109/APEC.2012.6165817