High-resolution transmission electron microscopy (HR-TEM) has been used to investigate the structural properties of GeMn/Ge nanocolumns multilayer samples grown on Ge(001) substrates by means of molecular beam epitaxy (MBE) system. Four bilayers with the spacer thickness in the range between 6 nm and 15 nm and 10 periods of bilayers of Ge0.94Mn0.06/Ge nanocolumn are presented. A simplified 2D model based on the theory of elastic constant interactions has been used to provide reasonable explanations to the vertical self-organization of GeMn nanocolumns in multilayers.
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Forschungszentrum Julich, Res Ctr, Inst Thin Film & Ion Technol, D-52425 Julich, GermanyForschungszentrum Julich, Res Ctr, Inst Thin Film & Ion Technol, D-52425 Julich, Germany
Goryll, M
Vescan, L
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Forschungszentrum Julich, Res Ctr, Inst Thin Film & Ion Technol, D-52425 Julich, GermanyForschungszentrum Julich, Res Ctr, Inst Thin Film & Ion Technol, D-52425 Julich, Germany
Vescan, L
Lüth, H
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Forschungszentrum Julich, Res Ctr, Inst Thin Film & Ion Technol, D-52425 Julich, GermanyForschungszentrum Julich, Res Ctr, Inst Thin Film & Ion Technol, D-52425 Julich, Germany
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Forschungszentrum Julich, Res Ctr, Inst Thin Film & Ion Technol, D-52425 Julich, GermanyForschungszentrum Julich, Res Ctr, Inst Thin Film & Ion Technol, D-52425 Julich, Germany
Goryll, M
Vescan, L
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Forschungszentrum Julich, Res Ctr, Inst Thin Film & Ion Technol, D-52425 Julich, GermanyForschungszentrum Julich, Res Ctr, Inst Thin Film & Ion Technol, D-52425 Julich, Germany
Vescan, L
Lüth, H
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h-index: 0
机构:
Forschungszentrum Julich, Res Ctr, Inst Thin Film & Ion Technol, D-52425 Julich, GermanyForschungszentrum Julich, Res Ctr, Inst Thin Film & Ion Technol, D-52425 Julich, Germany