Optical stress probe: in-situ stress mapping with Raman and Photo-stimulated luminescence spectroscopy

The optical stress probe system, developed in this work, provides a non-invasive method of monitoring and mapping the optical properties of a material during in situ stress tests. The design and construction of such a system was achieved by coupling a fiber optic probe based spectrometer system with an electromechanical loading system. This novel instrumentation integration enables the quantitative study of Raman or Photo-stimulated luminescence peak shifts with stress, known as piezospectroscopy. It further enables mapping of these spectral shifts over a surface of the specimen under load. To achieve this, a focusing method was developed that optimizes the intensity of specific optical bands of interest with the probe position. Individual software programs for the various systems that make up the instrumentation including the spectrometer, load frame and the XYZ stage were integrated and a single user interface was created. The system was calibrated by replicating published linear correlation between compressive stress and spectral peak position, 2.5cm(-1)/GPa for polycrystalline alumina.