Magnetic thin films;
magnetization reversal;
magnetoresistance;
permalloy;
D O I:
10.1109/TMAG.2011.2104373
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
Although the effects of high frequency electromagnetic wave on magnetization reversal are extensively studied, the influence of low frequency ac field on magnetization reversal is seldom studied. In this research, the magnetoresistance measurement is performed to study the switching field variation under ac fields of frequencies 25 kHz, 405 kHz, and 750 kHz applied in different directions with respect to ferromagnetic elliptical thin films. It can be observed that the switching fields of the ellipses subject to in-plane ac fields are reduced significantly compared to the case without ac field, the reduction of the switching field can be up to 17% in this experiment. However, the switching fields of the ellipses subject to out-of-plane ac fields are not reduced compared to the case without ac field.
机构:
Natl Ctr Sci Res Demokritos, Inst Adv Mat Physicochem Proc Nanotechnol & Micro, Athens 15310, GreeceNatl Ctr Sci Res Demokritos, Inst Adv Mat Physicochem Proc Nanotechnol & Micro, Athens 15310, Greece
Stamopoulos, D.
Zeibekis, M.
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机构:
Natl Ctr Sci Res Demokritos, Inst Adv Mat Physicochem Proc Nanotechnol & Micro, Athens 15310, GreeceNatl Ctr Sci Res Demokritos, Inst Adv Mat Physicochem Proc Nanotechnol & Micro, Athens 15310, Greece
Zeibekis, M.
Zhang, S. J.
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机构:
Penn State Univ, Mat Res Inst, University Pk, PA 16802 USANatl Ctr Sci Res Demokritos, Inst Adv Mat Physicochem Proc Nanotechnol & Micro, Athens 15310, Greece
机构:
Argonne Natl Lab, Div Mat Sci, Lemont, IL 60439 USAArgonne Natl Lab, Div Mat Sci, Lemont, IL 60439 USA
Tanase, M.
Petford-Long, A. K.
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机构:
Argonne Natl Lab, Div Mat Sci, Lemont, IL 60439 USAArgonne Natl Lab, Div Mat Sci, Lemont, IL 60439 USA
Petford-Long, A. K.
Heinonen, O.
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机构:
Seagate Technol, Recording Heads Operat, Bloomington, MN 55435 USAArgonne Natl Lab, Div Mat Sci, Lemont, IL 60439 USA
Heinonen, O.
Buchanan, K. S.
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机构:
Argonne Natl Lab, Ctr Nanoscale Mat, Lemont, IL 60439 USAArgonne Natl Lab, Div Mat Sci, Lemont, IL 60439 USA
Buchanan, K. S.
Sort, J.
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机构:
Univ Autonoma Barcelona, ICREA, Bellaterra 08193, Spain
Univ Autonoma Barcelona, Dept Fis, Bellaterra 08193, SpainArgonne Natl Lab, Div Mat Sci, Lemont, IL 60439 USA
Sort, J.
Nogues, J.
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机构:
ICN CSIC, Ctr Invest Nanociencia & Nanotecnol, Bellaterra 08193, SpainArgonne Natl Lab, Div Mat Sci, Lemont, IL 60439 USA
机构:
Sindhi Soc, VES Coll Arts Sci & Commerce, Bombay 400071, Maharashtra, IndiaSindhi Soc, VES Coll Arts Sci & Commerce, Bombay 400071, Maharashtra, India
Gupta, Rachana
Gupta, Mukul
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机构:
Bhabha Atom Res Ctr, UGC DAE Consortium Sci Res, Bombay 400085, Maharashtra, IndiaSindhi Soc, VES Coll Arts Sci & Commerce, Bombay 400071, Maharashtra, India
Gupta, Mukul
Gutberlet, Thomas
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机构:
ETH, Neutron Scattering Lab, CH-5232 Villigen, Switzerland
Paul Scherrer Inst, CH-5232 Villigen, SwitzerlandSindhi Soc, VES Coll Arts Sci & Commerce, Bombay 400071, Maharashtra, India
Gutberlet, Thomas
PRAMANA-JOURNAL OF PHYSICS,
2008,
71
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: 1123
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1127