Structural and optical properties of ZnxMn1-xSe (0≤x≤0.20) films

被引：0
作者：
Babu, T. Mohan [1 ]
Reddy, B. K. [1 ]
Rao, N. Madhusudhana [2 ]
Vijayalakshmi, R. P. [1 ]
Reddy, D. Raja [1 ]
Uthanna, S. [1 ]
机构：
[1] Sri Venkateswara Univ, Dept Phys, Tirupati 517502, Andhra Pradesh, India
[2] VIT Univ, Sch Sci & Humanities, Vellore 632014, Tamil Nadu, India
来源：
OPTOELECTRONICS AND ADVANCED MATERIALS-RAPID COMMUNICATIONS | 2010年 / 4卷 / 10期
关键词：
Diluted magnetic semiconductors; Zn1-xMnxSe thin films structural; Optical properties; Photoluminescence; MAGNETIC SEMICONDUCTOR ZN1-XMNXSE; EPITAXY; SUPERLATTICES; EPILAYERS; GAP;
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Zn1-xMnxSe Diluted magnetic semiconducting films with x = 0.00, 0.10, 0.15 and 0.20 were formed at 523 K on glass substrates by co-evaporation. X-ray diffraction studies revealed that the films were polycrystalline in nature with zinc blende structure with preferential orientation along (111). Optical transmittance studies indicated a nonlinear variation of band gap with 'x' exhibiting a downward bowing at lower concentrations. All the films showed photoluminescence with composition dependent intensities and emission wavelengths.
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页码：1612 / 1616
页数：5
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