110 GHz Characterization of Coplanar Waveguides on GaN-on-Si Substrates

被引:19
|
作者
Marti, Diego [1 ]
Vetter, Mathias [1 ]
Alt, Andreas R. [1 ]
Benedickter, Hansruedi [1 ]
Bolognesi, C. R. [1 ]
机构
[1] Swiss Fed Inst Technol, Millimeter Wave Elect Grp, CH-8092 Zurich, Switzerland
关键词
CONDUCTOR-BACKED CPW; GATE ALGAN/GAN HEMTS; FINITE GROUND WIDTH; RADIATION CHARACTERISTICS; SILICON; PERFORMANCE; DISPERSION;
D O I
10.1143/APEX.3.124101
中图分类号
O59 [应用物理学];
学科分类号
摘要
We characterize the microwave loss in coplanar waveguides (CPWs) on AlGaN/GaN high-electron mobility transistor (HEMT) buffer layers on high-resistivity silicon (HR-Si) substrates, up to 110 GHz. To our knowledge, this is the first broadband characterization of CPWs on GaN-on-Si. Conventional CPWs on commercially available AlGaN/GaN on HR-Si HEMT layers show a loss as low as 0.8 dB/mm at 110 GHz. Losses are further reduced by etching trenches between the CPW conductors, reaching 0.47 dB/mm at 110 GHz. The work shows that CPWs on GaN-on-Si exhibit performances comparable to those built on semi-insulating InP, demonstrating the suitability of GaN-on-Si technology in millimeter-wave applications. (C) 2010 The Japan Society of Applied Physics
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页数:3
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